Konica Minolta Spectrophotometer Bench Top-CM-3220d

Principal Specifications CM-3220d

Illumination / Viewing system

Reflectance d:8° equipped with simultaneous measurement of SCI (di:8° specular component included) and SCE (de:8° specular component excluded)
Conforms to CIE, ISO, ASTME, DIN and JIS

Sphere size

Ø 52 mm

Light receiving element

Silicon photodiode array (dual 40 elements)

Spectral separation device

Diffraction grating

Wavelength range, pitch

360-740 nm, 10 nm


Approx. 10 nm

Reflectance range

0-200%, resolution 0.01%

Light source

2 pulsed xenon arc lamp

Measurement / Illumination area

Ø 8 mm / Ø 11 mm


Spectral Reflectance: Standard deviation within 0.1% (360 to 380 nm within 0.2%) Colorimetric Value: Standard deviation within ΔE*ab 0.04
Measurement conditions: White calibration plate measured 30 times at 10-second intervals after white calibration was performed

Inter Instrument agreement

Mean ΔE*ab 0.2 (based on 12 BCRA Series II colour tiles)

Dimensions (W x H x D)

232 x 115 x 181 mm


4 kg


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